发明名称 |
Structure including voltage controlled negative resistance |
摘要 |
Aspects of the invention provide a semiconductor tunneling device including voltage controlled negative resistance. In one embodiment, the semiconductor tunneling device includes: at least one pair of spaced apart terminals; an inter-level dielectric (ILD) layer between the at least one pair of spaced apart terminals; and a dielectric capping layer extending continuously over the at least one pair of spaced apart terminals and the ILD layer.
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申请公布号 |
US8525153(B2) |
申请公布日期 |
2013.09.03 |
申请号 |
US201113323514 |
申请日期 |
2011.12.12 |
申请人 |
CHEN FEN;HUANG ELBERT E.;SHINOSKY MICHAEL A.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
CHEN FEN;HUANG ELBERT E.;SHINOSKY MICHAEL A. |
分类号 |
H01L29/06 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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