发明名称 Structure including voltage controlled negative resistance
摘要 Aspects of the invention provide a semiconductor tunneling device including voltage controlled negative resistance. In one embodiment, the semiconductor tunneling device includes: at least one pair of spaced apart terminals; an inter-level dielectric (ILD) layer between the at least one pair of spaced apart terminals; and a dielectric capping layer extending continuously over the at least one pair of spaced apart terminals and the ILD layer.
申请公布号 US8525153(B2) 申请公布日期 2013.09.03
申请号 US201113323514 申请日期 2011.12.12
申请人 CHEN FEN;HUANG ELBERT E.;SHINOSKY MICHAEL A.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHEN FEN;HUANG ELBERT E.;SHINOSKY MICHAEL A.
分类号 H01L29/06 主分类号 H01L29/06
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