发明名称 Method of making wafer structure for backside illuminated color image sensor
摘要 An integrated circuit device is provided. The integrated circuit device can include a substrate; a first radiation-sensing element disposed over a first portion of the substrate; and a second radiation-sensing element disposed over a second portion of the substrate. The first portion comprises a first radiation absorption characteristic, and the second portion comprises a second radiation absorption characteristic different from the first radiation absorption characteristic.
申请公布号 US8525286(B2) 申请公布日期 2013.09.03
申请号 US20090537167 申请日期 2009.08.06
申请人 HSU TZU-HSUAN;HSIEH CHRIS;YAUNG DUN-NIAN;YU CHUNG-YI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSU TZU-HSUAN;HSIEH CHRIS;YAUNG DUN-NIAN;YU CHUNG-YI
分类号 H01L31/00 主分类号 H01L31/00
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