发明名称 |
Shallow trench isolation structure and method for forming the same |
摘要 |
The invention provides a STI structure and method for forming the same. The STI structure includes a semiconductor substrate; a first trench embedded in the semiconductor substrate and filled up with a first dielectric layer; and a second trench formed on a top surface of the semiconductor substrate and interconnected with the first trench, wherein the second trench is filled up with a second dielectric layer, a top surface of the second dielectric layer is flushed with that of the semiconductor substrate, and the second trench has a width smaller than that of the first trench. The invention reduces dimension of divots and improves performance of the semiconductor device.
|
申请公布号 |
US8525188(B2) |
申请公布日期 |
2013.09.03 |
申请号 |
US201113132068 |
申请日期 |
2011.01.27 |
申请人 |
ZHONG HUICAI;LIANG QINGQING;YIN HAIZHOU;INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES |
发明人 |
ZHONG HUICAI;LIANG QINGQING;YIN HAIZHOU |
分类号 |
H01L31/0312;H01L29/00;H01L29/76;H01L29/94;H01L31/062 |
主分类号 |
H01L31/0312 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|