发明名称 Shallow trench isolation structure and method for forming the same
摘要 The invention provides a STI structure and method for forming the same. The STI structure includes a semiconductor substrate; a first trench embedded in the semiconductor substrate and filled up with a first dielectric layer; and a second trench formed on a top surface of the semiconductor substrate and interconnected with the first trench, wherein the second trench is filled up with a second dielectric layer, a top surface of the second dielectric layer is flushed with that of the semiconductor substrate, and the second trench has a width smaller than that of the first trench. The invention reduces dimension of divots and improves performance of the semiconductor device.
申请公布号 US8525188(B2) 申请公布日期 2013.09.03
申请号 US201113132068 申请日期 2011.01.27
申请人 ZHONG HUICAI;LIANG QINGQING;YIN HAIZHOU;INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES 发明人 ZHONG HUICAI;LIANG QINGQING;YIN HAIZHOU
分类号 H01L31/0312;H01L29/00;H01L29/76;H01L29/94;H01L31/062 主分类号 H01L31/0312
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