发明名称 Test terminal and setup system including the same of substrate processing apparatus
摘要 A setup system at least including a substrate processing apparatus and a test terminal is provided. The substrate processing apparatus includes a plurality of process chambers, a plurality of process chamber control units, a comprehensive control unit and an operation unit. The test terminal is connected to the plurality of process chamber control units while the comprehensive control unit and the operation unit are disconnected from the plurality of process chamber control units. The test terminal transmits a process chamber test operation command to the plurality of process chamber control units by executing a test terminal program. The setup system is capable of reducing time necessary for a setup process when starting to operate the substrate processing apparatus with the plurality of process chambers.
申请公布号 US8527078(B2) 申请公布日期 2013.09.03
申请号 US201213621320 申请日期 2012.09.17
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 OKUNO MASANORI
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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