发明名称 Lithographic apparatus with cleaning of substrate table
摘要 There is provided an exposure apparatus capable of accurately performing an exposure process and a measurement process based on a liquid immersion method. The exposure apparatus (EX), which forms a liquid immersion area (AR2) of a liquid (LQ) on an image surface side of a projection optical system (PL), and exposes a substrate (P) via the projection optical system (PL) and the liquid (LQ) of the immersion area (AR2), is provided with a measuring device (60) which measures at least one of a property and composition of the liquid (LQ) for forming the liquid immersion area (AR2).
申请公布号 US8525971(B2) 申请公布日期 2013.09.03
申请号 US20070767441 申请日期 2007.06.22
申请人 SHIRAISHI KENICHI;NIKON CORPORATION 发明人 SHIRAISHI KENICHI
分类号 G03B27/52;G03F7/20;H01L21/027 主分类号 G03B27/52
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