发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device including a high quality graphene having a lower resistivity than the conventional and fewer crystal defects as much as possible.SOLUTION: The manufacturing method of a semiconductor device comprises a step of forming a promoter layer having a face-centered cubic structure above the surface of a semiconductor substrate. The promoter layer is formed so that the (111) plane of the face-centered cubic structure is oriented in parallel with the surface of a semiconductor substrate. A catalyst layer having a face-centered cubic structure is formed on the promoter layer. The catalyst layer is formed so that the (111) plane of the face-centered cubic structure is oriented in parallel with the surface of a semiconductor substrate. A portion of the promoter layer in contact with the catalyst layer has a face-centered cubic structure. The catalyst layer is subjected to oxidation treatment and then subjected to reduction treatment thus planarizing the exposed surface of the catalyst layer. Finally, a graphene layer is formed on the catalyst layer.
申请公布号 JP2013172083(A) 申请公布日期 2013.09.02
申请号 JP20120036377 申请日期 2012.02.22
申请人 TOSHIBA CORP 发明人 KITAMURA MASAYUKI;SAKATA ATSUKO;WADA MAKOTO;YAMAZAKI YUICHI;KATAGIRI MASAYUKI;KAJITA AKIHIRO;SAKAI TADASHI;SAKUMA HISASHI;MIZUSHIMA ICHIRO
分类号 H01L21/3205;C23C16/26;H01L21/28;H01L21/285;H01L21/768;H01L23/532 主分类号 H01L21/3205
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