发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device including a high quality graphene having a lower resistivity than the conventional and fewer crystal defects as much as possible.SOLUTION: The manufacturing method of a semiconductor device comprises a step of forming a promoter layer having a face-centered cubic structure above the surface of a semiconductor substrate. The promoter layer is formed so that the (111) plane of the face-centered cubic structure is oriented in parallel with the surface of a semiconductor substrate. A catalyst layer having a face-centered cubic structure is formed on the promoter layer. The catalyst layer is formed so that the (111) plane of the face-centered cubic structure is oriented in parallel with the surface of a semiconductor substrate. A portion of the promoter layer in contact with the catalyst layer has a face-centered cubic structure. The catalyst layer is subjected to oxidation treatment and then subjected to reduction treatment thus planarizing the exposed surface of the catalyst layer. Finally, a graphene layer is formed on the catalyst layer. |
申请公布号 |
JP2013172083(A) |
申请公布日期 |
2013.09.02 |
申请号 |
JP20120036377 |
申请日期 |
2012.02.22 |
申请人 |
TOSHIBA CORP |
发明人 |
KITAMURA MASAYUKI;SAKATA ATSUKO;WADA MAKOTO;YAMAZAKI YUICHI;KATAGIRI MASAYUKI;KAJITA AKIHIRO;SAKAI TADASHI;SAKUMA HISASHI;MIZUSHIMA ICHIRO |
分类号 |
H01L21/3205;C23C16/26;H01L21/28;H01L21/285;H01L21/768;H01L23/532 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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