发明名称 |
INSULATION STRUCTURE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>INSULATING STRUCTURE AND PRODUCTION METHOD OF SAME TECHNICAL FIELDAn insulating structure is formed that favorably maintains gap-fill capability of a narrow width pattern 5 in a memory cell while also preventing the formation of cracks in an insulator in a peripheral circuit, and has the memory cell and peripheral circuit within the same layer. The present invention provides an insulating structure comprising a substrate and a circuit pattern 10 formed on the substrate, wherein the circuit pattern has a narrow width region having a narrow width pattern of a width of 30 nm or less and a wide width region having a wide width pattern of a width of greater than 100 nm in the same layer, and the same insulating composition is 15 formed within the narrow width pattern and within the wide width pattern.Figure 1</p> |
申请公布号 |
SG191313(A1) |
申请公布日期 |
2013.08.30 |
申请号 |
SG20130048491 |
申请日期 |
2011.12.22 |
申请人 |
ASAHI KASEI E-MATERIALS CORPORATION |
发明人 |
DOI, ICHIRO;TAKADA, SHOZO;MISHIMA, REIKO;SAITO, HIDEO |
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