发明名称 |
NITRIDE SEMICONDUCTOR COMPONENT AND METHOD FOR THE PRODUCTION THEREOF |
摘要 |
THE INVENTION RELATES TO A METHOD FOR PRODUCING A LAYER STRUCTURE (102) OF A NITRIDE SEMICONDUCTOR COMPONENT ON A SILICON SURFACE, SAID METHOD COMPRISING THE FOLLOWING STEPS: A SUBSTRATE (104) HAVING A SILICON SURFACE IS PREPARED; A NITRIDE NUCLEATION LAYER (106) CONTAINING ALUMINIUM IS DEPOSITED ON THE SILICON SURFACE OF THE SUBSTRATE; A NITRIDE BUFFER LAYER CONTAINING ALUMINIUM IS OPTIONALLY DEPOSITED ON THE NITRIDE NUCLEATION LAYER; A MASKING LAYER (108, B) IS DEPOSITED ON THE NITRIDE NUCLEATION LAYER OR ON THE FIRST NITRIDE BUFFER LAYER (A) IF PRESENT; AND A FIRST NITRIDE SEMICONDUCTOR LAYER (110) CONTAINING GALLIUM IS DEPOSITED ON THE MASKING LAYER, THE MASKING LAYER BEING DEPOSITED IN SUCH A WAY THAT SEPARATE CRYSTALLITES FIRST INTERGROW IN THE DEPOSITION STEP OF THE FIRST NITRIDE SEMICONDUCTOR LAYER, ABOVE A COALESCENCE LAYER THICKNESS, AND COVER AN AVERAGE SURFACE OF AT LEAST 0.16 �M2 IN A LAYER PLANE OF THE INTERGROWING NITRIDE SEMICONDUCTOR LAYER, PERPENDICULARLY TO THE DIRECTION OF GROWTH. |
申请公布号 |
MY149325(A) |
申请公布日期 |
2013.08.30 |
申请号 |
MY2008PI03249 |
申请日期 |
2007.02.22 |
申请人 |
AZZURRO SEMICONDUCTORS AG |
发明人 |
DADGAR, ARMIN;KROST, ALOIS |
分类号 |
H01L21/205;H01L33/00;H01L33/22 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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