发明名称 PROBE CARD AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a probe card which ensures excellent high frequency characteristics while achieving a narrow pitch of probe needles.SOLUTION: A probe card 1 includes: a coaxial cable 3 extending from an input side to an output side; a prove needle 4 which is connected with the coaxial cable 3 and extends from it and whose distance from other probe needles 4 becomes shorter toward the output side; and a coaxial tube 6 which covers the prove needle 4 and which has a smaller diameter than the coaxial cable 3.
申请公布号 JP2013167503(A) 申请公布日期 2013.08.29
申请号 JP20120030326 申请日期 2012.02.15
申请人 TOKYO CATHODE LABORATORY CO LTD 发明人 SEGAMI YASUSHI;MIYAMOTO DAISUKE;HONDA HIDEKAZU;NISHIJIMA TERUHIKO;BANYA KEIKO
分类号 G01R1/073;G01R31/26;H01L21/66 主分类号 G01R1/073
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