发明名称 |
STRUCTURE WITH ELECTROLESS NICKEL PLATING FILM, SEMICONDUCTOR WAFER, AND PRODUCTION METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a structure with an electroless Ni plating film generating no crack and few warpage, a semiconductor wafer generating no crack in the Ni plating film and few warpage when forming a UBM in a semiconductor wafer by electroless plating, and a production method thereof.SOLUTION: A structure with an Ni plating film formed on a substrate with electroless Ni plating is provided: wherein, the Ni plating film is formed with electroless Ni plating with which a columnar crystalline Ni plating film is formed, and with electroless Ni plating with which an amorphous Ni plating film is formed; and, after the columnar crystalline Ni plating film is formed to 50-90% of the total film thickness of the Ni plating film, the amorphous Ni plating film is formed on the columnar crystalline Ni plating film to 10-50% of the total film thickness of the Ni plating film. A semiconductor wafer is also provided which has a structure in which the Ni plating film is formed on electrode surfaces of the substrate. |
申请公布号 |
JP2013166998(A) |
申请公布日期 |
2013.08.29 |
申请号 |
JP20120031406 |
申请日期 |
2012.02.16 |
申请人 |
JX NIPPON MINING & METALS CORP |
发明人 |
DOGE HISANORI;TSUCHIDA KATSUYUKI |
分类号 |
C23C18/52;C23C18/34;H01L21/3205;H01L21/60;H01L21/768;H01L23/522;H01L23/532 |
主分类号 |
C23C18/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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