发明名称 VERTICAL RESISTANCE MEMORY DEVICE AND A READ METHOD THEREOF
摘要 A read method of a vertical resistance memory device including resistance memory cells arranged in a three-dimensional array includes selecting a block from a plurality of blocks, applying a read voltage to a word line selected from word lines of the block, applying a sensing reference voltage to bit lines sharing the plurality of blocks, applying a string selection voltage to a string selection transistor through a string selection line selected from a plurality of string selection lines of the block, wherein the string selection line is connected to a gate of the string selection transistor; and determining a memory state of a memory cell selected from the plurality of resistance memory cells by the word line and the string selection line based on a current flowing through the memory cell, wherein the word line is connected through a corresponding horizontal electrode to the memory cell.
申请公布号 US2013223127(A1) 申请公布日期 2013.08.29
申请号 US201213708018 申请日期 2012.12.07
申请人 SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JINTAEK;PARK YOUNGWOO;CHOI JUNGDAL
分类号 G11C11/21 主分类号 G11C11/21
代理机构 代理人
主权项
地址
您可能感兴趣的专利