发明名称 DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To accurately detect a defect part.SOLUTION: An imaging unit picks up an image of an inspection target and generates image data, a smoothing unit spatially smoothes a signal value included in the image data and generates reference value data, a first defect information generation unit detects a first defect part from the image data on the basis of the reference value data and a predetermined first detection condition, an image information storage unit correspondingly stores defect-including image data including an image of the detected first defect part and the reference value data used for detecting the first defect part, and a second defect information generation unit detects a second defect part from the defect-including image data on the basis of the reference value data and a second detection condition.
申请公布号 JP2013167483(A) 申请公布日期 2013.08.29
申请号 JP20120029692 申请日期 2012.02.14
申请人 MECC CO LTD 发明人 TANAKA KUNIYASU
分类号 G01N21/88;G01N21/892 主分类号 G01N21/88
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