发明名称 Semiconductor device and oxide semiconductor layer
摘要 <p>The invention provides a transistor comprising a gate electrode layer; a gate insulating layer over the gate electrode layer; an oxide semiconductor layer over the gate insulating layer; and an oxide insulating layer over and in contact with the oxide semiconductor layer, wherein the oxide semiconductor layer includes indium, zinc, and one or more metal elements selected from gallium, aluminum, manganese, cobalt and tin; and wherein a region of the oxide semiconductor layer is formed of microcrystals c-axis-oriented in a direction perpendicular to a surface of the oxide semiconductor layer.</p>
申请公布号 KR101301461(B1) 申请公布日期 2013.08.29
申请号 KR20137010677 申请日期 2010.08.26
申请人 发明人
分类号 G02F1/136;H01L21/336;H01L29/786 主分类号 G02F1/136
代理机构 代理人
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