发明名称 |
CHARGED PARTICLE BEAM DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a charged particle beam device capable of selecting proper pre-processing conditions in performing automatic brightness and contrast adjustment.SOLUTION: There is provided a charged particle beam device including: a plurality of noise elimination filters which eliminate noise of an electric signal; a measurement section which measures a contrast noise ratio after applying one of the noise elimination filters; and a determination section which determines magnitude between the contrast noise ratio measured by the measurement section and a preset threshold. |
申请公布号 |
JP2013168215(A) |
申请公布日期 |
2013.08.29 |
申请号 |
JP20120029057 |
申请日期 |
2012.02.14 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
SUZUKI MAKOTO;ASAO KAZUNARI |
分类号 |
H01J37/22 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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