发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device capable of selecting proper pre-processing conditions in performing automatic brightness and contrast adjustment.SOLUTION: There is provided a charged particle beam device including: a plurality of noise elimination filters which eliminate noise of an electric signal; a measurement section which measures a contrast noise ratio after applying one of the noise elimination filters; and a determination section which determines magnitude between the contrast noise ratio measured by the measurement section and a preset threshold.
申请公布号 JP2013168215(A) 申请公布日期 2013.08.29
申请号 JP20120029057 申请日期 2012.02.14
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SUZUKI MAKOTO;ASAO KAZUNARI
分类号 H01J37/22 主分类号 H01J37/22
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