发明名称 INSPECTION METHOD AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device capable of attaining high image quality such as resolution enhancement corresponding to a structure of an image acquired by a camera and a defective part.SOLUTION: An inspection device includes a camera 201, an image processor 202, a storage device 203, and a GUI 204. The image processor 202 acquires a moving image of an inspection object captured by the camera 201, divides the acquired moving image into multiple image frames, generates a division moving image by dividing the respective image frames into multiple division areas, calculates index values related to strength of image quality enhancement processing for each division moving image, generating a moving image with high image quality by setting the strength of image quality enhancement processing corresponding to the values of index values for each division moving image and performing image quality enhancement processing, allows the GUI 204 to display the generated moving image with high image quality, and allows the storage device 203 to store the moving image with high image quality.
申请公布号 JP2013168779(A) 申请公布日期 2013.08.29
申请号 JP20120030507 申请日期 2012.02.15
申请人 HITACHI-GE NUCLEAR ENERGY LTD 发明人 HOSOYA NAOKI;NAKAHIRA KENJI;MIYAMOTO ATSUSHI;WATANABE TAKASHI
分类号 H04N5/225;G01B11/30;G01N21/88;G06T1/00;G21C17/003;G21C17/08;H04N5/232 主分类号 H04N5/225
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