发明名称 METHODS OF PROVIDING THIN LAYERS OF CRYSTALLINE SEMICONDUCTOR MATERIAL, AND RELATED STRUCTURES AND DEVICES
摘要 Methods of fabricating semiconductor devices include forming a metal silicide in a portion of a crystalline silicon layer, and etching the metal silicide using an etchant selective to the metal silicide relative to the crystalline silicon to provide a thin crystalline silicon layer. Silicon-on-insulator (SOI) substrates may be formed by providing a layer of crystalline silicon over a base substrate with a dielectric material between the layer of crystalline silicone and the base substrate, and thinning the layer of crystalline silicon by forming a metal silicide layer in a portion of the crystalline silicon, and then etching the metal silicide layer using an etchant selective to the metal silicide layer relative to the crystalline silicon.
申请公布号 WO2013124719(A1) 申请公布日期 2013.08.29
申请号 WO2013IB00139 申请日期 2013.02.01
申请人 SOITEC 发明人 SADAKA, MARIAM;RADU, IONUT
分类号 H01L21/306;H01L21/3213;H01L21/762 主分类号 H01L21/306
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