发明名称 |
TEST SOCKET WITH HOOK-LIKE PIN CONTACT EDGE |
摘要 |
The present invention provides a test socket adaptable for testing different Integrated Circuit (IC) pad size during an IC testing. The test socket comprising a molded socket having an inner space and a plurality of through-apertures disposed on its surface; and a plurality of contact elements disposed within the inner space of the molded socket, each contact element has a pin contact edge and a pin-end; wherein each pin contact edge extends through the through-apertures of the molded socket; wherein each pin contact edge provides a linear surface area for contact with the DUT's lead; and wherein each pin contact edge provides a large contact area for various DUT's lead size. |
申请公布号 |
WO2013126016(A1) |
申请公布日期 |
2013.08.29 |
申请号 |
WO2012SG00431 |
申请日期 |
2012.11.19 |
申请人 |
TEST MAX MANUFACTURING PTE LTD |
发明人 |
TAN HUI LI, NATALI;TAN HUI SHAN, MELISA |
分类号 |
G01R1/04;G01R1/073 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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