发明名称 DEFECT CLASSIFICATION SYSTEM AND DEFECT CLASSIFICATION DEVICE AND IMAGING DEVICE
摘要 In a defect classification system using plural types of observation devices that acquire images having different characteristics, classification performance and operability of the system are improved. The a defect classification system includes plural imaging part that acquire images of an inspection target, a defect classification device that classifies the acquired images acquired by the plural imaging part, and a communication part that transmits data between the plural imaging devices and the defect classification device, in which the defect classification device includes an image storage part that stores the acquired image data acquired by the plural imaging part, an information storage part that stores associated information about the input image data, and a part for changing a processing method or a display method depending on the associated information.
申请公布号 US2013222574(A1) 申请公布日期 2013.08.29
申请号 US201113878256 申请日期 2011.10.03
申请人 NAKAGAKI RYO;HARADA MINORU;HIRAI TAKEHIRO 发明人 NAKAGAKI RYO;HARADA MINORU;HIRAI TAKEHIRO
分类号 G06T7/00 主分类号 G06T7/00
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