发明名称 |
ACTIVE LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND RESIST FILM EACH USING SAID COMPOSITION, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE AND ELECTRONIC DEVICE EACH USING THESE |
摘要 |
PROBLEM TO BE SOLVED: To provide: an active light-sensitive or radiation-sensitive resin composition which is excellent in sensitivity, resolution, roughness performance and long-term stability while reducing generation of an outgas; a pattern forming method and a resist film using the composition; and a method for manufacturing an electronic device and the electronic device using these.SOLUTION: An active light-sensitive or radiation-sensitive resin composition contains a compound represented by the specified general formula (Z1), which generates an acid when irradiated with active light or radiation. |
申请公布号 |
JP2013167826(A) |
申请公布日期 |
2013.08.29 |
申请号 |
JP20120032099 |
申请日期 |
2012.02.16 |
申请人 |
FUJIFILM CORP |
发明人 |
TAKIZAWA HIROO;TSUCHIMURA TOMOTAKA |
分类号 |
G03F7/004;C07C381/12;G03F7/038;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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