发明名称 SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME
摘要 Provided is a double-sided cooling structure for a semiconductor device using a low processing temperature and reduced processing time utilizing solid phase diffusion bonding. The fabrication method for this system is provided. The semiconductor device 1 comprising: a mounting substrate 70; a semiconductor chip 10 disposed on the mounting substrate 70 and a semiconductor substrate 26, a source pad electrode SP and a gate pad electrode GP disposed on a surface of the semiconductor substrate 26, and a drain pad electrode 36 disposed on a back side surface of the semiconductor substrate 26 to be contacted with the mounting substrate 70; and a source connector SC disposed on the source pad electrode SP. The mounting substrate 70 and the drain pad electrode 36 are bonded by using solid phase diffusion bonding.
申请公布号 US2013221514(A1) 申请公布日期 2013.08.29
申请号 US201213403341 申请日期 2012.02.23
申请人 OTSUKA TAKUKAZU;WESTERN BRYON;PASSMORE BRANDON;COLE ZACH;ROHM CO., LTD.;ARKANSAS POWER ELECTRONICS INTERNATIONAL, INC. 发明人 OTSUKA TAKUKAZU;WESTERN BRYON;PASSMORE BRANDON;COLE ZACH
分类号 H01L23/36;H01L21/60 主分类号 H01L23/36
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