发明名称 CMOS DEVICES AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A complementary metal-oxide semiconductor (CMOS) device is disclosed. The CMOS device includes a substrate, a well region formed in the substrate, and a gate formed on the substrate. The CMOS device also includes a first region and a second region formed in the well region and arranged at two sides of the gate. Further, the CMOS device includes a first light-doped drain (LDD) region and a second LDD region formed in the well region and extending the first region and the second region, respectively, towards the gate. The CMOS device also includes a first doped layer formed in the first LDD region, and a conduction type of an ion doped in the first doped layer is opposite to a conduction type of an ion doped in the first LDD region.</p>
申请公布号 EP2630662(A1) 申请公布日期 2013.08.28
申请号 EP20110849144 申请日期 2011.11.30
申请人 CSMC TECHNOLOGIES FAB1 CO., LTD.;CSMC TECHNOLOGIES FAB2 CO., LTD. 发明人 WU, HSIAOCHIA;GUO, LI;HAN, GUANGTAO;YAN, JIAN
分类号 H01L29/78;H01L21/8238;H01L29/10 主分类号 H01L29/78
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