发明名称 |
INSPECTION SOCKET USING BUCKING PIN |
摘要 |
PURPOSE: A testing socket using a buckling pin is provided to improve a mounting property and assembling reliability and to reduce sizes. CONSTITUTION: A testing socket (800) includes a first socket plate (100), a second socket plate (200), and a buckling probe pin. The first socket plate places first pin holes. The second socket plate faces the first socket plate and includes second pin holes. The buckling probe pin includes a first contact unit, a fixing unit, a second contact unit, and a bending unit. The first contact unit is fixed with the first pin holes. The fixing unit is fixed with the second pin holes. The second contact unit has a pillar shape formed on the fixing unit. The bending unit is buckled by the first and the second pin holes and formed with the first and the second contact units. |
申请公布号 |
KR101299722(B1) |
申请公布日期 |
2013.08.28 |
申请号 |
KR20120067132 |
申请日期 |
2012.06.22 |
申请人 |
DEVELOPMENT PLUS CO., LTD. |
发明人 |
KIM, JEONG GYU;LEE, BANG KEUN;KIM, WOONG KYUM |
分类号 |
G01R1/067;G01R31/26;G01R31/28 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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