发明名称 INSPECTION SOCKET USING BUCKING PIN
摘要 PURPOSE: A testing socket using a buckling pin is provided to improve a mounting property and assembling reliability and to reduce sizes. CONSTITUTION: A testing socket (800) includes a first socket plate (100), a second socket plate (200), and a buckling probe pin. The first socket plate places first pin holes. The second socket plate faces the first socket plate and includes second pin holes. The buckling probe pin includes a first contact unit, a fixing unit, a second contact unit, and a bending unit. The first contact unit is fixed with the first pin holes. The fixing unit is fixed with the second pin holes. The second contact unit has a pillar shape formed on the fixing unit. The bending unit is buckled by the first and the second pin holes and formed with the first and the second contact units.
申请公布号 KR101299722(B1) 申请公布日期 2013.08.28
申请号 KR20120067132 申请日期 2012.06.22
申请人 DEVELOPMENT PLUS CO., LTD. 发明人 KIM, JEONG GYU;LEE, BANG KEUN;KIM, WOONG KYUM
分类号 G01R1/067;G01R31/26;G01R31/28 主分类号 G01R1/067
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