发明名称 DIFFERENTIAL PHASE-CONTRAST IMAGING
摘要 The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating (14, 15) for X-ray differential phase-contrast imaging, is provided with a first sub-area (23) comprising at least one portion (24) of a first grating structure (26) and at least one portion (28) of a second grating structure (30). The first grating structure comprises a plurality of bars (34) and gaps (36) with a first grating orientation GO1 (37), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars (40) and gaps (42) with a second grating orientation GO2 (44), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation Got is different than the second grating orientation GO2. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example.
申请公布号 EP2630476(A1) 申请公布日期 2013.08.28
申请号 EP20110776579 申请日期 2011.10.17
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH 发明人 ROESSL, EWALD
分类号 G01N23/04;A61B6/00;A61B6/06;G01N23/20;G21K1/06 主分类号 G01N23/04
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