首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Memory cell array comprising nanogap memory elements
摘要
申请公布号
EP2202797(A3)
申请公布日期
2013.08.28
申请号
EP20090179361
申请日期
2009.12.16
申请人
FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC.;FUNAI ELECTRIC CO., LTD.
发明人
TAKAHASHI, TSUYOSHI;HAYASHI, YUTAKA;MASUDA, YUICHIRO;FURUTA, SHIGEO;ONO, MASATOSHI
分类号
H01L27/24;G11C13/00;G11C13/02
主分类号
H01L27/24
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PROCESS AND CIRCUIT FOR THE DETECTION OF AN APPROACH TO AN ELECTRODE DEVICE
SINGLE LAYER TRANSCAPACITIVE SENSING
System and Method for Measuring Movement of a Component from Rings Magnetized in a Magnetically Hard Layer
BALANCE CIRCUIT AND INVERTER CIRCUIT COMPRISING THE SAME
AC-LED PROTECTION CIRCUIT
SHELF, IN PARTICULAR FOR REFRIGERATED INSTALLATIONS
COMPUTER ENCLOSURE
SYSTEM AND METHOD FOR SUPPORTING HIGH BURST CURRENT IN A CURRENT LIMITED SYSTEM
POLYPHASE TRANSVERSE AND/OR COMMUTATED FLUX SYSTEMS
WAVE ENERGY ABSORBER
High Breakdown Voltage Double-Gate Semiconductor Device
HIGH VOLTAGE FLOATING WELL IN A SILICON DIE
GATE STRUCTURES OF CMOS DEVICE AND METHOD FOR MANUFACTURING THE SAME
SEMICONDUCTOR DEVICE WITH CAPACITOR AND FUSE AND ITS MANUFACTURE
REDUCED ANGULAR EMISSION CONE ILLUMINATION LEDS
ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE
Radiation imaging apparatus
Semiconductor device and semiconductor device manufacturing method
RADIOMETRIC MEASURING OF THIN FLUID FILMS
VARIABLE FREQUENCY CONTROLLING SYSTEM AND METHOD OF SHREDDER