发明名称 Methods of forming copper-based conductive structures on an integrated circuit device
摘要 Disclosed herein are various methods of forming copper-based conductive structures on integrated circuit devices. In one example, the method includes the steps of forming a trench/via in a layer of insulating material, forming a copper-based seed layer above the layer of insulating material and in the trench/via, performing a heating process on the copper-based seed layer to increase an amount of the copper-based seed layer positioned proximate a bottom of the trench/via, performing an etching process on said copper-based seed layer and performing an electroless copper deposition process to fill the trench/via with a copper-based material.
申请公布号 US8517769(B1) 申请公布日期 2013.08.27
申请号 US201213422295 申请日期 2012.03.16
申请人 LIN SEAN X.;HE MING;ZHANG XUNYUAN;ZHAO LARRY;GLOBALFOUNDRIES INC. 发明人 LIN SEAN X.;HE MING;ZHANG XUNYUAN;ZHAO LARRY
分类号 H01L21/4763;H01L21/00 主分类号 H01L21/4763
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