发明名称 Accelerating automatic test pattern generation in a multi-core computing environment via speculatively scheduled sequential multi-level parameter value optimization
摘要 Systems and methods provide acceleration of automatic test pattern generation in a multi-core computing environment via multi-level parameter value optimization for a parameter set with speculative scheduling. The methods described herein use multi-core based parallel runs to parallelize sequential execution, speculative software execution to explore possible parameter sets, and terminate/prune runs when the optimum parameter value is found at a previous level. The present invention evaluates the design prior to the implementation of the compression IP so that it can define the configuration of DFT and ATPG to maximize the results of compression as measured by test data volume and test application time.
申请公布号 US8521464(B2) 申请公布日期 2013.08.27
申请号 US20100793466 申请日期 2010.06.03
申请人 KUMAR ASHWIN;BALASUBRAMANIAN RAMAKRISHNAN;KAPUR ROHIT;UPPULURI RAJESH;SAIKIA JYOTIRMOY;BHATTACHARYA PARTHAJIT;TIYYAGURA SUNIL REDDY;SYNOPSYS, INC. 发明人 KUMAR ASHWIN;BALASUBRAMANIAN RAMAKRISHNAN;KAPUR ROHIT;UPPULURI RAJESH;SAIKIA JYOTIRMOY;BHATTACHARYA PARTHAJIT;TIYYAGURA SUNIL REDDY
分类号 G01R31/02;G01R31/00;G01R31/28;G01R31/302 主分类号 G01R31/02
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