发明名称 Method for producing an integrated field-effect transistor
摘要 A method for fabricating a field-effect transistor is provided. The method includes forming a substrate region, forming two terminal regions at the substrate region, one terminal region being a source region and the other terminal region being a drain region, forming two electrically insulating insulating layers, which are arranged at mutually opposite sides of the substrate region and are adjoined by control regions, forming an electrically conductive connecting region, which electrically conductively connects one of the terminal regions and the substrate region the conductive connecting region comprising a metal-semiconductor compound, leveling a surface by chemical mechanical polishing after forming the control regions, etching-back the control regions after polishing, and performing a self-aligning method for forming the metal-semiconductor compound in the etched-back regions, on the substrate region, and on a terminal region.
申请公布号 US8518759(B2) 申请公布日期 2013.08.27
申请号 US20100848576 申请日期 2010.08.02
申请人 KAKOSCHKE RONALD;INFINEON TECHNOLOGIES AG 发明人 KAKOSCHKE RONALD
分类号 H01L21/00;H01L21/336;H01L21/84;H01L27/115;H01L27/12;H01L29/786 主分类号 H01L21/00
代理机构 代理人
主权项
地址