| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of controlling a value of power source voltage that becomes lower according to fluctuation in delay characteristics in a chip due to change in operation mode.SOLUTION: In a semiconductor integrated circuit LSI1 of an embodiment, a voltage regulator 1 supplies a power source voltage VDD of a set value, and a chip is divided into a plurality of regions according to distribution of an operation current. A delay test circuit 2 is disposed in each region where much operation current flows in respective operation modes. A test control part 3 controls execution of a delay time test using the delay test circuit 2 in a test mode by lowering the power source voltage VDD stepwise. A power source voltage determination part 4 determines a value of power source voltage in each operation mode on the basis of the delay time test result, and the value is stored in a storage part 5. A power source voltage setting part 6, at the start of execution of each operation mode, reads a value of the power source voltage in an interested operation mode out of the storage part 5, and sets it as a value of output voltage of the voltage regulator 1. |
