发明名称 LIQUID METAL ION SOURCE AND SECONDARY ION MASS SPECTROMETRIC METHOD AND USE THEREOF
摘要 A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight >=190 U and, on the other hand, another metal with an atomic weight @90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
申请公布号 US2013216427(A1) 申请公布日期 2013.08.22
申请号 US201313832684 申请日期 2013.03.15
申请人 KOLLMER FELIX;HOERSTER PETER;DUETTING ANDREAS;ION-TOF TECHNOLOGIES GMBH 发明人 KOLLMER FELIX;HOERSTER PETER;DUETTING ANDREAS
分类号 H01J49/10;C22C12/00 主分类号 H01J49/10
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