发明名称 DIAGNOSTICS FOR A PROGRAMMABLE LOGIC CONTROLLER
摘要 To reduce the cost and/or space occupied by diagnostic circuitry (34) in a module of a programmable logic controller (24) with multiple outputs (28), a multiplexer (26) connects the same diagnostic circuitry (34) to the different outputs (28). The outputs (28) are sequentially tested with the same circuitry (34). To limit stress on an output driver (36), an overload (30) condition may be tested while the driver is off. A different source (32) of power is applied to the output (28), and the results of the application are measured (56) for shorting to ground.
申请公布号 WO2013123342(A2) 申请公布日期 2013.08.22
申请号 WO2013US26368 申请日期 2013.02.15
申请人 SIEMENS AKTIENGESELLSCHAFT;WEDDLE, ROBERT ALAN;ARCHER, JAMES F. 发明人 WEDDLE, ROBERT ALAN;ARCHER, JAMES F.
分类号 G01R31/317 主分类号 G01R31/317
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