发明名称 PATTERN FORMATION METHOD AND METAL STRUCTURE FORMATION METHOD
摘要 A resist layer made of oxonol-based dye, and the OD value of which is greater than or equal to 1.0 and less than or equal to 1.6 with respect to light having the wavelength of 580 nm, is formed on a substrate. The formed resist layer is scanned with a laser beam at a scan speed of higher than or equal to 3 m/s and lower than or equal to 10 m/s. A ring-shaped pattern is formed by developing the resist layer scanned with the laser beam using a developer containing alcohol as a main component.
申请公布号 US2013213932(A1) 申请公布日期 2013.08.22
申请号 US201313851607 申请日期 2013.03.27
申请人 FUJIFILM CORPORATION;FUJIFILM CORPORATION 发明人 UMEZAWA TOMOKAZU
分类号 G03F7/20 主分类号 G03F7/20
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