发明名称 Improved process for transfer of a thin layer formed in a substrate with vacancy clusters
摘要 Methods for forming semiconductor structures comprising a layer transferred from a donor substrate are provided in which the resulting structure has improved quality with respect to defects and resulting structures therefrom. For example, a semiconductor-on-insulator (SeOI) structure can be formed by a method comprising:—providing a donor substrate having a first density of vacancy clusters;—providing an insulating layer;—transferring a thin layer from the donor substrate to a support substrate with the insulating layer thereon;—curing the transferred thin layer to reduce the first density of vacancy clusters to a second density; and being characterized in that the step of providing an insulating layer comprises providing an oxygen barrier layer to be in contact with the transferred thin layer, the oxygen barrier layer limiting diffusion of oxygen toward the thin layer during the curing.
申请公布号 KR101299211(B1) 申请公布日期 2013.08.22
申请号 KR20097008227 申请日期 2006.10.27
申请人 发明人
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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