| 摘要 |
PROBLEM TO BE SOLVED: To create a movement route of a probe, which can improve inspection efficiency, in a short period of time.SOLUTION: A movement route creation device of a probe comprises: a processing section which connects movement routes Ra of respective first areas passing through all probing points P included in the first areas (A1 to A6) formed by partitioning the surface of a circuit board 100 in a lattice shape, in a connection order, and creates a movement route of the whole circuit board 100. The processing section specifies, for the first area closest to an initial position L, a movement route Ra from a start point Ps included in a second area (Ba1) closest to the initial position L among second areas formed by partitioning the first area into four to an end point Pe included in another second area (Bc1) located in a diagonal position of the second area (Ba1), and specifies, for each first areas of the second connection order and after, a movement route Ra from a start point Ps included in a second area (Bd2) closest to the end point Pe of the nearest high-order first area to an end point Pe included in another second area (Bb2) located in a diagonal position of the second area. |
