发明名称 METHOD OF MEASURING TILT ANGLE OF ALIGNMENT FILM, OPTICAL ALIGNMENT FILM, AND OPTICAL ANISOTROPIC BODY
摘要 PROBLEM TO BE SOLVED: To provide a method of measuring a tilt angle of an alignment film being a thin film by accurate and simple means; and an optical alignment film that has excellent sensitivity suitable for mass productivity, and has liquid crystal alignment capability that is not decreased even under exposure to high temperature, that is, has excellent heat resistance.SOLUTION: Provided is a method of measuring a tilt angle with respect to a substrate of an alignment film material by polarized infrared multiple-angle incidence resolution spectrometry. Also provided is an alignment film obtained by applying a composition for an alignment film containing one or more alignment materials and one or more solvents on the substrate, and performing alignment processing after drying the composition for an alignment film. In the alignment film, the alignment processing decreases a tilt angle with respect to the substrate of the alignment film.
申请公布号 JP2013164613(A) 申请公布日期 2013.08.22
申请号 JP20130085736 申请日期 2013.04.16
申请人 DIC CORP 发明人 KUWANA YASUHIRO;NISHIYAMA ISA
分类号 G02F1/1337 主分类号 G02F1/1337
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