| 摘要 |
A memory device for providing memory bit repair. The memory device may include memory cells. Each of the memory cells may include a measurable characteristic that identifies a stored data value. At least one of the memory cells may have a measurable characteristic set to a defective bit state. A defective bit state may refer to a measurable characteristic set to be outside of a working measureable characteristic range. The defective bit state may enable memory bit repair by identifying the at least one memory cell as being defective.
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