发明名称 REPLACEMENT GATE ELECTRODE WITH A TANTALUM ALLOY METAL LAYER
摘要 A tantalum alloy layer is employed as a work function metal for field effect transistors. The tantalum alloy layer can be selected from TaC, TaAl, and TaAlC. When used in combination with a metallic nitride layer, the tantalum alloy layer and the metallic nitride layer provides two work function values that differ by 300 mV~500 mV, thereby enabling multiple field effect transistors having different threshold voltages. The tantalum alloy layer can be in contact with a first gate dielectric in a first gate, and the metallic nitride layer can be in contact with a second gate dielectric having a same composition and thickness as the first gate dielectric and located in a second gate.
申请公布号 US2013214364(A1) 申请公布日期 2013.08.22
申请号 US201213398314 申请日期 2012.02.16
申请人 JAGANNATHAN HEMANTH;PARUCHURI VAMSI K.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 JAGANNATHAN HEMANTH;PARUCHURI VAMSI K.
分类号 H01L27/088;H01L21/8236 主分类号 H01L27/088
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