发明名称 VARIABLE RESISTANCE MEMORY DEVICE HAVING EQUAL RESISTANCES BETWEEN SIGNAL PATHS REGARDLESS OF LOCATION OF MEMORY CELLS WITHIN THE MEMORY ARRAY
摘要 A memory device including variable resistance elements comprises a plurality of memory cells configured to store data; a first signal transmission/reception unit and a second signal transmission/reception unit configured to transmit a signal to the memory cells or receive a signal from the memory cells; a first transmission line arranged to couple first ends of the memory cells to the first signal transmission/reception unit; and a second transmission line configured to couple second ends of the memory cells to the second signal transmission/reception unit, wherein a first resistance of a first signal path coupled between the first and second signal transmission/reception units through a first memory cell of the memory cells is substantially equal to a second electrical resistance of a second signal path coupled between a second memory cell and the first and second signal transmission/reception units through a second memory cell of the memory cells.
申请公布号 US2013215665(A1) 申请公布日期 2013.08.22
申请号 US201313844899 申请日期 2013.03.16
申请人 SK HYNIX INC.;SK HYNIX INC. 发明人 HWANG SANG MIN
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项
地址