发明名称 INSPECTION SYSTEM AND METHOD
摘要 An inspection region of a mask is virtually divided by stripes, and a pattern on a position error correcting unit is also virtually divided by stripes. Then, a stage is moved such that all the stripes of both the mask and the position error correcting unit are continuously scanned, so that optical images of these stripes are acquired. Fluctuation values of position coordinates of the patterns formed on the position error correcting unit are acquired from the optical images of the position error correcting unit. Based upon the fluctuation values, fluctuation values of the position coordinates of the respective patterns in the inspection region of the mask are obtained so that the position coordinates are corrected. Thereafter, a map is generated from the fluctuation values of the position coordinates of the respective patterns in the inspection region of the mask.
申请公布号 US2013216120(A1) 申请公布日期 2013.08.22
申请号 US201313768392 申请日期 2013.02.15
申请人 NUFLARE TECHNOLOGY, INC.;NUFLARE TECHNOLOGY, INC. 发明人 INOUE TAKAFUMI;MATSUMOTO EIJI;KIKUIRI NOBUTAKA;ISOMURA IKUNAO
分类号 G06T7/00 主分类号 G06T7/00
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