发明名称 SELF-TEST OF OVER-CURRENT FAULT DETECTION
摘要 A system for testing over-current fault detection includes a first switch to connect a voltage to a load and a capacitor; a first monitor circuit that monitors a current from the first switch to the load; a second monitor circuit that monitors a voltage across the capacitor; and a microcontroller configured to control a state of the first switch to connect voltage to the load and verifies over-current detection based upon current generated during charging of the capacitor. The microcontroller detects an over-current fault condition based upon input from the first monitor circuit and detects a short-circuit fault condition based upon input from the second monitor circuit during test of the first monitor circuit.
申请公布号 US2013214806(A1) 申请公布日期 2013.08.22
申请号 US201213559128 申请日期 2012.07.26
申请人 SALOIO, JR. JAMES;GOSSE JAMES A.;HAMILTON SUNDSTRAND CORPORATION 发明人 SALOIO, JR. JAMES;GOSSE JAMES A.
分类号 G01R31/02 主分类号 G01R31/02
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