发明名称 |
SELF-TEST OF OVER-CURRENT FAULT DETECTION |
摘要 |
A system for testing over-current fault detection includes a first switch to connect a voltage to a load and a capacitor; a first monitor circuit that monitors a current from the first switch to the load; a second monitor circuit that monitors a voltage across the capacitor; and a microcontroller configured to control a state of the first switch to connect voltage to the load and verifies over-current detection based upon current generated during charging of the capacitor. The microcontroller detects an over-current fault condition based upon input from the first monitor circuit and detects a short-circuit fault condition based upon input from the second monitor circuit during test of the first monitor circuit.
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申请公布号 |
US2013214806(A1) |
申请公布日期 |
2013.08.22 |
申请号 |
US201213559128 |
申请日期 |
2012.07.26 |
申请人 |
SALOIO, JR. JAMES;GOSSE JAMES A.;HAMILTON SUNDSTRAND CORPORATION |
发明人 |
SALOIO, JR. JAMES;GOSSE JAMES A. |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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