发明名称 SELF-TEST OF OVER-CURRENT FAULT DETECTION
摘要 A system for testing over-current fault detection includes a first switch to connect a voltage to a load, a capacitor connected between the first switch and ground, a monitor circuit that monitors a current from the first switch to the load, and a microcontroller configured to detect an over-current fault condition based upon input from the monitor circuit. The microcontroller controls the state of the first switch to connect voltage to the load and verifies over-current detection based upon current generated during charging of the capacitor.
申请公布号 US2013214805(A1) 申请公布日期 2013.08.22
申请号 US201213401053 申请日期 2012.02.21
申请人 SALOIO, JR. JAMES;NGUYEN AN;HAMILTON SUNDSTRAND CORPORATION 发明人 SALOIO, JR. JAMES;NGUYEN AN
分类号 G01R31/02 主分类号 G01R31/02
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