| 摘要 |
<p>An inspection device (10) comprises an SC (supercontinuum) light source (110), an optical system (light guide section: 154) and a spectroscopic section (130). The SC light source (110) generates supercontinuum light (SC light) as a first inspection light. The optical system (154) inputs the first inspection light to a wavelength conversion element (20). The wavelength conversion element (20) is a ferroelectric crystal comprising a polarization-reversed structure. The spectroscopic section (130) spectroscopically analyzes output light that has been output from the wavelength conversion element (20), and detects one or multiple first peak wavelengths.</p> |
