发明名称 X-ray dark-field imaging system and method
摘要 An x-ray imaging technology, performing an x-ray dark-field CT imaging of an examined object using an imaging system which comprises an x-ray source, two absorbing gratings G1 and G2, an x-ray detector, a controller and a data processing unit, comprising the steps of: emitting x-rays to the examined object; enabling one of the two absorbing gratings G1 and G2 to perform phase stepping motion within at least one period range thereof; where in each phase stepping step, the detector receives the x-ray and converts it into an electric signal; wherein through the phase stepping of at least one period, the x-ray intensity at each pixel point on the detector is represented as an intensity curve; calculating a second moment of scattering angle distribution for each pixel, based on a contrast of the intensity curve at each pixel point on the detector and an intensity curve without presence of the examined object; taking images of the object at various angles, then obtaining an image with scattering information of the object in accordance with a CT reconstruction algorithm.
申请公布号 US8515002(B2) 申请公布日期 2013.08.20
申请号 US201013147952 申请日期 2010.07.06
申请人 HUANG ZHIFENG;CHEN ZHIQIANG;ZHANG LI;WANG ZHENTIAN;XING YUXIANG;ZHAO ZIRAN;XIAO YONGSHUN;TSINGHUA UNIVERSITY;NUCTECH COMPANY LIMITED 发明人 HUANG ZHIFENG;CHEN ZHIQIANG;ZHANG LI;WANG ZHENTIAN;XING YUXIANG;ZHAO ZIRAN;XIAO YONGSHUN
分类号 A61B6/00 主分类号 A61B6/00
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