发明名称 System and process for roof measurement using aerial imagery
摘要 The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
申请公布号 US8515125(B2) 申请公布日期 2013.08.20
申请号 US201313750449 申请日期 2013.01.25
申请人 PICTOMETRY INTERNATIONAL CORP. 发明人 THORNBERRY CHRIS T.;THORNBERRY DALE R.;GARRINGER MARK F.
分类号 G06K9/00 主分类号 G06K9/00
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