发明名称 Semiconductor device and method capable of scribing chips with high yield
摘要 A semiconductor device comprising scribe areas that include dicing areas for separating chip areas, a groove forming area surrounding each chip area, and includes interlayer insulating lamination disposed above the semiconductor wafer; a multilayer wiring structure formed in the interlayer insulating lamination, the multilayer wiring structure including wiring layers disposed in the chip area, and dummy wirings disposed in the chip area and the scribe area, the wiring layers and the dummy wirings being formed from same mother layers; a cover layer including a passivation layer, the cover layer covering the multilayer wiring structure; and a groove formed in each groove forming area, the groove surrounding the chip areas and extending from a surface of the semiconductor wafer and at least through the passivation layer; wherein the multilayer wiring structure includes no dummy wirings in the groove forming area at least in an uppermost wiring layer.
申请公布号 US8513776(B2) 申请公布日期 2013.08.20
申请号 US20050200126 申请日期 2005.08.10
申请人 OTSUKA SATOSHI;FUJITSU SEMICONDUCTOR LIMITED 发明人 OTSUKA SATOSHI
分类号 H01L23/544;H01L21/301;H01L21/3205;H01L21/768;H01L21/78;H01L23/485;H01L23/522;H01L23/58 主分类号 H01L23/544
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