发明名称 Method and structure for forming high performance MOS capacitor along with fully depleted semiconductor on insulator devices on the same chip
摘要 An integrated circuit is provided that includes a fully depleted semiconductor device and a capacitor present on a semiconductor on insulator (SOI) substrate. The fully depleted semiconductor device may be a finFET semiconductor device or a planar semiconductor device. In one embodiment, the integrated circuit includes a substrate having a first device region and a second device region. The first device region of the substrate includes a first semiconductor layer that is present on a buried insulating layer. The buried insulating layer that is in the first device region is present on a second semiconductor layer of the substrate. The second device region includes the second semiconductor layer, but the first semiconductor layer and the buried insulating layer are not present in the second device region. The first device region includes the fully depleted semiconductor device. A capacitor is present in the second device region.
申请公布号 US8513723(B2) 申请公布日期 2013.08.20
申请号 US20100689743 申请日期 2010.01.19
申请人 BOOTH, JR. ROGER A.;CHENG KANGGUO;DORIS BRUCE B.;SHAHIDI GHAVAM G.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BOOTH, JR. ROGER A.;CHENG KANGGUO;DORIS BRUCE B.;SHAHIDI GHAVAM G.
分类号 H01L27/12 主分类号 H01L27/12
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