发明名称 Test apparatus and circuit apparatus
摘要 There is provided a test apparatus for testing a device under test, including a plurality of operational units that operate in response to control data supplied thereto to test the device under test, a control section that generates packet data containing the control data and unit selection data indicating which one or more of the plurality of operational units are to be selected, and a plurality of data transfer units that are cascade-connected to each other so that the packet data is transferred from each of the plurality of data transfer units to a data transfer unit of a following stage, where each of the plurality of data transfer units corresponds to one or more of the plurality of operational units. Here, when each of the plurality of data transfer units receives the packet data whose unit selection data indicates that one or more of the operational units corresponding thereto are to be selected, the data transfer unit inputs the control data contained in the packet data into the selected operational units or reads data from the selected operational units.
申请公布号 US8516430(B2) 申请公布日期 2013.08.20
申请号 US20100687086 申请日期 2010.01.13
申请人 KOZUKA NORIYOSHI;ADVANTEST CORPORATION 发明人 KOZUKA NORIYOSHI
分类号 G06F17/50 主分类号 G06F17/50
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