BASE UNIT OF SEMICONDUCTOR TESTING DEVICE AND SEMICONDUCTOR TESTING DEVICE

摘要

PROBLEM TO BE SOLVED: To perform stably connector fitting operation without increasing sizes of connectors in a base unit including the connectors having a floating structure.SOLUTION: The base unit of a semiconductor testing device includes a vibration surface on which a plurality of connectors having the floating structure are arranged and a vibrator for vibrating the vibration surface on a plane vertical to a fitting direction of the connectors. The vibration surface can be constituted as a floating structure from a base unit body. A vertical vibrator for vibrating the vibration surface in the same direction as the fitting direction of the connectors is also allowed to be included in the base unit.