发明名称 TIME-SERIES DATA INQUIRY DEVICE, METHOD FOR INQUIRING TIME-SERIES DATA, AND TIME-SERIES DATA INQUIRY PROGRAM
摘要 PROBLEM TO BE SOLVED: To perform an inquiry with constraint conditions using signal values observed in different times.SOLUTION: An inquiry expression is input in a time-series data inquiry device 100, the inquiry expression representing an inquiry content for a first signal value storage device stored with signal values observed by a sensor for every observed time, and prescribing constraint conditions using two or more signal values with different reference times. The time-series data inquiry device 100 reads each signal value in the constraint conditions prescribed in the inquiry expression, from the first signal value storage device, normalizes time lag and stores it in a second signal storage device, and acquires a result of the inquiry expression excluding time information from the constraint conditions prescribed in the inquiry expression using the signal value stored in the second signal storage device.
申请公布号 JP2013161101(A) 申请公布日期 2013.08.19
申请号 JP20120019725 申请日期 2012.02.01
申请人 MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC BUILDING TECHNO SERVICE CO LTD 发明人 IMAMURA MAKOTO;YONEYAMA JUNICHI;KITAGAMI SHINJI
分类号 G06F17/30;G05B23/02 主分类号 G06F17/30
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