发明名称 METHOD OF DEFECT CLASSIFICATION BASED ON DESIGN AND SYSTEM FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an inspection system for classifying defects detected on a generation layer of a sample, a classification unit which can operate with the inspection system, and a computer execution method for classifying defects.SOLUTION: A classification method includes the steps of: acquiring input data relevant to detected defects; processing the input data by using determination algorithm associated with a generation layer to specify two or more classification operations and an order of them; and screening the processed defects by advance definition bins. Each bin is associated with at least one classification operation, in the at least one classification operation, at least a part of the processed defects is screened to one or more classification bins to bring the finally classified defects; and in each classification operation, at least a part of the processed defects is screened so as to be processed by one or more subsequent classification operations except the last classification operation.
申请公布号 JP2013162133(A) 申请公布日期 2013.08.19
申请号 JP20130032553 申请日期 2013.02.04
申请人 APPLIED MATERIALS ISRAEL LTD 发明人 MARK GESHEL;ZVI GOREN;EFRAT ROSENMAN
分类号 H01L21/66;G06F17/50 主分类号 H01L21/66
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