发明名称 SURFACE DEFECT INSPECTION METHOD AND SURFACE DEFECT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To rate an inspected object on the basis of a minute defect that becomes a problem at the time of frequent occurrence.SOLUTION: A determination unit 17 executes the steps of: calculating a surface defect quantity in each unit area formed by dividing an inspected object 10 in longitudinal and width directions, on the basis of a type and level of surface defect; comparing the surface defect quantity with a defect quantity threshold and extracting a unit area with the surface defect quantity greater than the defect quantity threshold as a threshold exceeding area; determining whether or not a unit area adjacent in the longitudinal direction of the threshold exceeding area is the threshold exceeding area, with respect to each of the extracted threshold exceeding areas; extracting the threshold exceeding area as a longitudinally-sequential threshold exceeding area when the unit area adjacent in the longitudinal direction of the threshold exceeding area is the threshold exceeding area; calculating the number of longitudinally-sequential threshold exceeding areas in the inspected object 10; and rating the inspected object 10 on the basis of the calculated number of longitudinally-sequential threshold exceeding areas.
申请公布号 JP2013160590(A) 申请公布日期 2013.08.19
申请号 JP20120021730 申请日期 2012.02.03
申请人 JFE STEEL CORP 发明人 UEHARA YUJI;TSURUMARU HIDEYUKI;YAMAOKA YUICHI
分类号 G01N21/88;G01N21/892 主分类号 G01N21/88
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